Tokyo Tech Research Repository (T2R2)

Patent Information

Title

レーザイオン化質量分析装置

Author

Kind

Patent

Status

Published

Applicant

国立大学法人東京工業大学, 学校法人工学院大学.

Filing Date

2010/04/23

Application Number

特願2010-099869

Unexamined Application Date

2011/11/17

Publication Number

特開2011-233248

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