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Patent Information


Title
テラヘルツ検出センサ及びテラヘルツ画像測定装置 
Author
Yukio Kawano.  
Kind
Patent 
Status
Registered 
Applicant
国立大学法人東京工業大学.  
Filing Date
2016/12/14
Application Number
特願2017-556092
Unexamined Application Date
2018/10/04
Publication Number
再表2017/104697
Registration Date
2020/08/28
Registration Number
特許第6755590号

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