Author,Title,Kind,Status,ApplicantName,ApplicationDate,ApplicationNumber,PublicationDate,PublicationNumber,RegistrationDate,RegistrationNumber
"Masaaki Fujii","微細部位イメージング装置","Patent","Registered","国立大学法人東京工業大学, 学校法人工学院大学","2012/07/24","特願2012-163242","2014/02/03","特開2014-022344","特許第6014801号","2016/10/07"
"Masaaki Fujii","レーザイオン化質量分析装置","Patent","Published","国立大学法人東京工業大学, 学校法人工学院大学","2010/04/23","特願2010-099869","2011/11/17","特開2011-233248",,
"Masaaki Fujii","イオンビーム照射位置決め装置","Patent","Published","国立大学法人東京工業大学, 学校法人工学院大学, 株式会社トヤマ","2010/04/23","特願2010-099870","2011/11/17","特開2011-233249",,
"Masaaki Fujii,Shun-ichi Ishiuchi","真空紫外光発生装置","Patent","Published","国立大学法人東京工業大学","2010/03/25","特願2010-070306","2011/10/13","特開2011-204882",,
"Masaaki Fujii,Shun-ichi Ishiuchi","集束イオンビームを用いる微細部位解析装置","Patent","Registered","国立大学法人東京工業大学, 新日本製鐵株式会社","2006/08/03","特願2006-212399","2008/02/21","特開2008-039521","特許第4785193号","2011/07/22"
"Masaaki Fujii,Shun-ichi Ishiuchi","イオン化分析装置及びイオン化分析方法","Patent","Registered","国立大学法人東京工業大学, 新日本製鐵株式会社","2006/06/09","特願2006-161691","2007/12/20","特開2007-327929","特許第4761378号","2011/06/17"
"Masaaki Fujii,Shun-ichi Ishiuchi,Makoto Sakai","ガス分析用Jet?REMPI装置","Patent","Registered","国立大学法人東京工業大学, 新日本製鐵株式会社","2006/05/24","特願2006-143953","2007/12/06","特開2007-315847","特許第4906403号","2012/01/20"
"Masaaki Fujii,Shun-ichi Ishiuchi","Jet-REMPI法を用いた高沸点物質の定量分析方法","Patent","Registered","国立大学法人東京工業大学, 新日本製鐵株式会社","2006/05/18","特願2006-139354","2007/11/29","特開2007-309793","特許第4969150号","2012/04/13"
"Masaaki Fujii,Makoto Sakai,Shun-ichi Ishiuchi","ガス分析用Jet-REMPI装置","Patent","Published","国立大学法人東京工業大学, 新日本製鐵株式会社, 株式会社日鐵テクノリサーチ, 株式会社島津製作所","2005/12/26","特願2005-371325","2007/07/05","特開2007-171064",,
"Masaaki Fujii","超解像顕微鏡","Patent","Published","国立大学法人東京工業大学, オリンパス株式会社","2004/08/18","特願2004-238688","2006/03/02","特開2006-058477",,
"Masaaki Fujii","超解像顕微鏡","Patent","Published","国立大学法人東京工業大学, オリンパス株式会社","2004/08/09","特願2004-232230","2006/02/16","特開2006-047912",,