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Publication Information
Title
Japanese:
English:
Mechanical Fatigue Tests of Solder Bumps
Author
Japanese:
Minoru Mukai, Hiroyuki Takahashi, Takashi Kawakami, Kuniaki Takahashi, Ken Iwasaki,
Kikuo Kishimoto
.
English:
Minoru Mukai, Hiroyuki Takahashi, Takashi Kawakami, Kuniaki Takahashi, Ken Iwasaki,
Kikuo Kishimoto
.
Language
English
Journal/Book name
Japanese:
English:
Advances in Electronic Packaging, EEP
Volume, Number, Page
Vol. 26 No. 1 pp. 449-455
Published date
1999
Publisher
Japanese:
English:
Conference name
Japanese:
English:
Conference site
Japanese:
English:
©2007
Tokyo Institute of Technology All rights reserved.