Electrostatic Detachment of a Micro-object from a Probe by Applied Voltage

Publication Information

Title

Japanese:
English:	Electrostatic Detachment of a Micro-object from a Probe by Applied Voltage

Author

Japanese:	齋藤滋規, Hideo Himeno, Kunio Takahashi, Tadao Onzawa.
English:	Shigeki Saito, Hideo Himeno, Kunio Takahashi, Tadao Onzawa.

Language

English

Journal/Book name

Japanese:
English:	Proc. 2002 IEEE/RSJ International Conference on Intelligent Robots and Systems

Volume, Number, Page

No. 2 pp. 1790-1795

Published date

2002

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: