Effective Escape Depth of Photoelectrons for Hydrocarbon Films in Total Electron Yield Measurement at the C K-Edge

Publication Information

Title

Japanese:
English:	Effective Escape Depth of Photoelectrons for Hydrocarbon Films in Total Electron Yield Measurement at the C K-Edge

Author

Japanese:	H. Ohara, Y. Yamamoto, K. Kajikawa, H. Ishii, K. Seki, Y. Ouchi.
English:	H. Ohara, Y. Yamamoto, K. Kajikawa, H. Ishii, K. Seki, Y. Ouchi.

Language

English

Journal/Book name

Japanese:
English:	J. Synchrotron Rad.

Volume, Number, Page

Vol. 6 pp. 803-804

Published date

1999

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: