Electrostatic detachment of an adhering particle from a micromanipulated probe

Publication Information

Title

Japanese:
English:	Electrostatic detachment of an adhering particle from a micromanipulated probe

Author

Japanese:	齋藤滋規, Hideo Himeno, Kunio Takahashi.
English:	Shigeki Saito, Hideo Himeno, Kunio Takahashi.

Language

English

Journal/Book name

Japanese:
English:	Journal of Applied Physics

Volume, Number, Page

Vol. 93 No. 4 pp. 2219-2224

Published date

2003

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI