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Title
Japanese:ひずみSi MOSFETのゲート トンネル電流に与えるひずみの効果 
English: 
Author
Japanese: 星井拓也, 菅原聡, 高木信一.  
English: 星井拓也, 菅原聡, 高木信一.  
Language Japanese 
Journal/Book name
Japanese: 
English: 
Volume, Number, Page         pp. 26a-x-7
Published date 2006 
Publisher
Japanese: 
English: 
Conference name
Japanese:第53回応用物理学関係連合講演会, 東京, 
English: 
Conference site
Japanese: 
English: 

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