Examination of the Universality of Hole Mobility in Strained-Si p-MOSFETs

Publication Information

Title

Japanese:
English:	Examination of the Universality of Hole Mobility in Strained-Si p-MOSFETs

Author

Japanese:	S.Takagi, K.Takeda, S.Sugahara, T.Numata.
English:	S.Takagi, K.Takeda, S.Sugahara, T.Numata.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

pp. paper B-2-1, pp.38-39

Published date

2005

Publisher

Japanese:
English:

Conference name

Japanese:
English:	2005 Intl. Conf. on Solid State Devices and Materials (SSDM2005), Kobe, Japan,

Conference site

Japanese:
English: