Error Control Coding for Semiconductor Memory Systems in the Space Radiation Environment

Publication Information

Title

Japanese:	Error Control Coding for Semiconductor Memory Systems in the Space Radiation Environment
English:	Error Control Coding for Semiconductor Memory Systems in the Space Radiation Environment

Author

Japanese:	Haruhiko Kaneko.
English:	Haruhiko Kaneko.

Language

English

Journal/Book name

Japanese:	Proc. 2005 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
English:	Proc. 2005 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volume, Number, Page

pp. 93-101

Published date

Oct. 2005

Publisher

Japanese:
English:

Conference name

Japanese:
English:	IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Conference site

Japanese:
English:	Monterey, California