Error Control Coding for Multilevel Cell Flash Memories Using Nonbinary Low-Density Parity-Check Codes

Publication Information

Title

Japanese:	Error Control Coding for Multilevel Cell Flash Memories Using Nonbinary Low-Density Parity-Check Codes
English:	Error Control Coding for Multilevel Cell Flash Memories Using Nonbinary Low-Density Parity-Check Codes

Author

Japanese:	前田遊, 金子晴彦.
English:	Yuu maeda, Haruhiko Kaneko.

Language

English

Journal/Book name

Japanese:	Proc. 2009 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI Systems
English:	Proc. 2009 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI Systems

Volume, Number, Page

pp. 367-375

Published date

Oct. 2009

Publisher

Japanese:
English:	IEEE

Conference name

Japanese:
English:	2009 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI Systems

Conference site

Japanese:
English:	Chicago, USA

DOI