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Title
Japanese:X線光電子分光法による酸化物ガラス中のO1s電子の状態の解析 
English: 
Author
Japanese: 瀬川浩代.  
English: Hiroyo Segawa.  
Type
Type:Thesis (Ph.D.) 
Country:Japan 
Language Japanese 
Organization name Tokyo Institute of Technology 
Report number 甲第4306号 
Conferred date 2000/03/26 
Judge  
File  (Organization name: Tokyo Institute of Technology) 

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