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Publication Information
Title
Japanese:
X線光電子分光法による酸化物ガラス中のO1s電子の状態の解析
English:
Author
Japanese:
瀬川浩代
.
English:
Hiroyo Segawa
.
Type
Type:
Thesis (Ph.D.)
Country:
Japan
Language
Japanese
Organization name
Tokyo Institute of Technology
Report number
甲第4306号
Conferred date
2000/03/26
Judge
File
(Organization name: Tokyo Institute of Technology)
©2007
Institute of Science Tokyo All rights reserved.