Interface trap level in top-contact pentacene thin-film transistors evaluated by displacement current measurement

Publication Information

Title

Japanese:
English:	Interface trap level in top-contact pentacene thin-film transistors evaluated by displacement current measurement

Author

Japanese:	鈴木聖一, 安武裕輔, 真島豊.
English:	Seiichi Suzuki, Yuhsuke Yasutake, Yutaka Majima.

Language

English

Journal/Book name

Japanese:
English:	Organic Electronics

Volume, Number, Page

Vol. 11 No. 4 pp. 594-598

Published date

Apr. 2010

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI