Variability-Tolerant CMOS Gates Using Functional MOSFETs with Resistive Switching Devices

Publication Information

Title

Japanese:
English:	Variability-Tolerant CMOS Gates Using Functional MOSFETs with Resistive Switching Devices

Author

Japanese:	周藤悠介, 山本修一郎, 菅原聡.
English:	Y. Shuto, S. Yamamoto, S. Sugahara.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

pp. 810-811

Published date

2009

Publisher

Japanese:
English:

Conference name

Japanese:
English:	Extended Abstracts of the 2009 International Conference on Solid State Devices and Materials

Conference site

Japanese:
English:	Sendai, Japan