Analysis of the Hanle effect in spin-MOSFETs | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:	スピンMOSFET におけるHanle 効果の解析
English:	Analysis of the Hanle effect in spin-MOSFETs

Author

Japanese:	高村陽太, 菅原聡.
English:	Yota Takamura, Satoshi Sugahara.

Language

Japanese

Journal/Book name

Japanese:
English:

Volume, Number, Page

2p-P-24

Published date

Sept. 6, 2011

Publisher

Japanese:
English:

Conference name

Japanese:	第72回応用物理学会学術講演会
English:	The 72nd Fall Meeting, 2011

Conference site

Japanese:	山形県山形市
English:	Yamagata, Yamagata

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