Antiferromagnetic layer thickness dependence of exchange bias in sputter-deposited Co/CoO/Co trilayer

Publication Information

Title

Japanese:
English:	Antiferromagnetic layer thickness dependence of exchange bias in sputter-deposited Co/CoO/Co trilayer

Author

Japanese:	WANG JIAN, 村石信二, 史蹟, 中村吉男.
English:	Jian Wang, Shinji Muraishi, Ji Shi, Nakamura Yoshio.

Language

English

Journal/Book name

Japanese:
English:	Abstract of the 7th International Forum on Advanced material Science and Technology

Volume, Number, Page

Published date

June 26, 2010

Publisher

Japanese:
English:	Dalian Institue of Technology, Chinese Materials Reserch Society in Japan

Conference name

Japanese:
English:	7th International Forum on Advance Materials

Conference site

Japanese:
English:	Dalian