X-ray diffraction study for atomic disorder in full-Heulser alloy thin films using Co x-ray source | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	X-ray diffraction study for atomic disorder in full-Heulser alloy thin films using Co x-ray source

Author

Japanese:	高村陽太, 菅原聡.
English:	Y. Takamura, S. Sugahara.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Jan. 18, 2010

Publisher

Japanese:
English:

Conference name

Japanese:
English:	11th MMM-Intermag Conf.

Conference site

Japanese:
English:	Washington, DC

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