Comparison of Interface Characterization between Ag(In,Ga)Se2 and Cu(In,Ga)Se2 Solar Cells by High-Angle-Annular Dark-Field Scanning Transmission Electron Microscopy

Publication Information

Title

Japanese:
English:	Comparison of Interface Characterization between Ag(In,Ga)Se2 and Cu(In,Ga)Se2 Solar Cells by High-Angle-Annular Dark-Field Scanning Transmission Electron Microscopy

Author

Japanese:	張険峰, 小林剛, 黒川康良, Yoshiyuki Tashiro, Masahiro Ohtsuka, Tomoyuki Yamada, 山田明.
English:	Zhang Xianfeng, Tsuyoshi Kobayashi, Yasuyoshi Kurokawa, Yoshiyuki Tashiro, Masahiro Ohtsuka, Tomoyuki Yamada, Akira Yamada.

Language

English

Journal/Book name

Japanese:
English:	Jpn. J. Appl. Phys.

Volume, Number, Page

50 126603

Published date

Nov. 24, 2011

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: