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Title
Japanese: 
English:The effect of remote Coulomb scattering on electron mobility in La2O3 gate stacked MOSFETs 
Author
Japanese: マイマイティ マイマイティレャアティ, 幸田みゆき, 川那子高暢, 角嶋邦之, パールハットアヘメト, 筒井一生, 片岡 好則, 西山彰, 杉井信之, 名取研二, 服部健雄, 岩井洋.  
English: マイマイティ マイマイティレャアティ, Miyuki Kouda, Takamasa Kawanago, Kuniyuki KAKUSHIMA, Ahmet Parhat, KAZUO TSUTSUI, 片岡 好則, 西山彰, Nobuyuki Sugii, KENJI NATORI, takeo hattori, HIROSHI IWAI.  
Language English 
Journal/Book name
Japanese: 
English:Semiconductor Science and Technology 
Volume, Number, Page Vol. 27    No. 4   
Published date Mar. 2012 
Publisher
Japanese: 
English: 
Conference name
Japanese: 
English: 
Conference site
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