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Title
Japanese: 
English:Secondary Resonance Magnetic Force Microscopy 
Author
Japanese: 田中傑, 東康男, 真島豊.  
English: Suguru Tanaka, Yasuo Azuma, YUTAKA MAJIMA.  
Language English 
Journal/Book name
Japanese: 
English:J. Appl. Phys. 
Volume, Number, Page Vol. 111        p. 084312
Published date Apr. 23, 2012 
Publisher
Japanese: 
English:American Institute of Physics 
Conference name
Japanese: 
English: 
Conference site
Japanese: 
English: 
File
DOI https://doi.org/10.1063/1.4705400
Abstract In this study, we have developed secondary resonance magnetic force microscopy (SR-MFM) for imaging alternating magnetic fields from a sample surface at the secondary resonant frequency of the magnetic cantilever at the same time as the topographic image. SR-MFM images of alternating magnetic fields diverging from the main pole in a driving perpendicular magnetic recording head are presented, and the divergence and convergence of the fields are discussed. The spatial resolution of SR-MFM is estimated to be 18 nm; this is 2.5 times smaller than that of conventional MFM.

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