Analysis of the Hanle effect in spin-MOSFETs (2) | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:	スピンMOSFETにおけるHanle効果の解析(2)
English:	Analysis of the Hanle effect in spin-MOSFETs (2)

Author

Japanese:	髙村陽太, 菅原聡.
English:	Yota Takamura, Satoshi Sugahara.

Language

Japanese

Journal/Book name

Japanese:
English:

Volume, Number, Page

11p-PA2-5

Published date

Sept. 11, 2012

Publisher

Japanese:
English:

Conference name

Japanese:	第73回応用物理学会学術講演会
English:

Conference site

Japanese:	愛媛県松山市
English:	Matsuyama, Ehime

DOI

https://doi.org/10.11470/jsapmeeting.2012.2.0_1914

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