Using High Frequency Acoustic Micro Imaging to Detect Defects in Artificial Micro Void Specimens

Publication Information

Title

Japanese:
English:	Using High Frequency Acoustic Micro Imaging to Detect Defects in Artificial Micro Void Specimens

Author

Japanese:	田原麻梨江, T. Azuma, K. Hashiba, T. Maruyama, Y. Kenbo.
English:	M. Tabaru, T. Azuma, K. Hashiba, T. Maruyama, Y. Kenbo.

Language

English

Journal/Book name

Japanese:
English:	Proceedings of 2010 IEEE International Ultrasonics Symposium

Volume, Number, Page

pp. 2388-2391 (P6-N1-4)

Published date

Oct. 2010

Publisher

Japanese:
English:

Conference name

Japanese:
English:	2010 IEEE International Ultrasonic Symposium

Conference site

Japanese:
English:	San Diego