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Title
Japanese: 
English:Interface reaction analysis of La2O3/SiC upon annealing by ATR-FTIR 
Author
Japanese: 雷 一鳴, 宗清修, 角嶋邦之, 川那子高暢, 片岡好則, 西山彰, 杉井信之, 若林整, 筒井一生, 名取研二, 岩井洋, M. Furuhashi, N. Miura, S. Yamakawa.  
English: 雷 一鳴, Shu Munekiyo, Kuniyuki KAKUSHIMA, Takamasa Kawanago, Yoshinori Kataoka, Akira Nishiyama, Nobuyuki Sugii, Hitoshi Wakabayashi, KAZUO TSUTSUI, Kenji Natori, HIROSHI IWAI, M. Furuhashi, N. Miura, S. Yamakawa.  
Language English 
Journal/Book name
Japanese: 
English: 
Volume, Number, Page        
Published date 2014 
Publisher
Japanese: 
English: 
Conference name
Japanese: 
English:The Workshop on Future Trend of Nanoelectronics:WIMNACT 39, February 7, 2014, Suzukake Hall, Suzukakedai Campus, Tokyo Institute of Technology, Japan 
Conference site
Japanese: 
English: 

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