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Home > Help Publication Information Title Japanese:   English: A Fast Process-Variation-Aware Mask Optimization Algorithm With a Novel Intensity Modeling  Author Japanese: AWAD Ahmed, 高橋 篤司, Satoshi Tanaka, Chikaaki Kodama.   English: Ahmed Awad, Atsushi Takahashi, Satoshi Tanaka, Chikaaki Kodama.   Language English  Journal/Book name Japanese:   English: IEEE Transactions on Very Large Scale Integration (VLSI) Systems  Volume, Number, Page Vol. 25    No. 3    pp. 998-1011 Published date Mar. 2017  Publisher Japanese:   English:   Conference name Japanese:   English:   Conference site Japanese:   English:   Official URL http://ieeexplore.ieee.org/document/7725551/   DOI https://doi.org/10.1109/TVLSI.2016.2616840

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