Characterization of electronic structure around metal-insulator transition in V1-xWxO2 thin films by thermopower measurement

Publication Information

Title

Japanese:	Characterization of electronic structure around metal-insulator transition in V1-xWxO2 thin films by thermopower measurement
English:	Characterization of electronic structure around metal-insulator transition in V1-xWxO2 thin films by thermopower measurement

Author

Japanese:	T. Katase, K. Endo, H. Ohta.
English:	T. Katase, K. Endo, H. Ohta.

Language

English

Journal/Book name

Japanese:	J. Ceram. Soc. Jpn.
English:	J. Ceram. Soc. Jpn.

Volume, Number, Page

vol. 123 p. 307-311

Published date

May 1, 2015

Publisher

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English:

Conference name

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Conference site

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