New power-gating architectures using nonvolatile retention: Comparative study of nonvolatile power-gating (NVPG) and normally-off architectures for SRAM

Publication Information

Title

Japanese:
English:	New power-gating architectures using nonvolatile retention: Comparative study of nonvolatile power-gating (NVPG) and normally-off architectures for SRAM

Author

Japanese:	周藤悠介, 山本修一郎, 菅原聡.
English:	Y. Shuto, S. Yamamoto, S. Sugahara.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

8-1

Published date

Mar. 28, 2016

Publisher

Japanese:
English:

Conference name

Japanese:
English:	29th IEEE International Conference on Microelectronic Test Structures (ICMTS)

Conference site

Japanese:
English:	Yokohama