Correlation between Electronic Structures and Instabilities in Amorphous Oxide Semiconductors: Strategies for High-Performance and Stable AOS-TFTs

Publication Information

Title

Japanese:
English:	Correlation between Electronic Structures and Instabilities in Amorphous Oxide Semiconductors: Strategies for High-Performance and Stable AOS-TFTs

Author

Japanese:	金正煥, 神谷利夫, 細野秀雄.
English:	Junghwan Kim, Toshio Kamiya, Hideo Hosono.

Language

English

Journal/Book name

Japanese:
English:	IMID 2017 DIGEST

Volume, Number, Page

p. 266

Published date

Aug. 28, 2017

Publisher

Japanese:
English:

Conference name

Japanese:
English:	International Meeting on Information Display (IMID)

Conference site

Japanese:
English:	Busan