Process Damage Influence for Electrical Property of Diamond Schottky Barrier Diodes

Publication Information

Title

Japanese:
English:	Process Damage Influence for Electrical Property of Diamond Schottky Barrier Diodes

Author

Japanese:	室岡拓也, K.Takizawa, Y.Kato, T.Makino, M.Ogura, H.Kato, R.Wada, S.Yamasaki, 岩崎孝之, H.Nohira, 波多野睦子.
English:	T.Murooka, K.Takizawa, Y.Kato, T.Makino, M.Ogura, H.Kato, R.Wada, S.Yamasaki, T.Iwasaki, H.Nohira, M.Hatano.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Sept. 13, 2018

Publisher

Japanese:
English:

Conference name

Japanese:
English:	2018International Conference on Solid State Devices and Materials

Conference site

Japanese:
English:	Tokyo