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Title
Japanese: 
English:Study on defects in amorphous oxide semiconductor, a-In-Ga-Zn-O 
Author
Japanese: 井手啓介.  
English: Keisuke Ide.  
Type
Type:Thesis (Ph.D.) Summary 
Country:Japan 
Language English 
Organization name Tokyo Institute of Technology 
Report number 乙第4146号 
Conferred date 2017/09/30 
Judge  
File   

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