Atomic and Electronic Structure of Ultrathin Bi(111) Films Grown on Bi2Te3(111) Substrates: Evidence for a Strain-Induced Topological Phase Transition

Publication Information

Title

Japanese:	Atomic and Electronic Structure of Ultrathin Bi(111) Films Grown on Bi2Te3(111) Substrates: Evidence for a Strain-Induced Topological Phase Transition
English:	Atomic and Electronic Structure of Ultrathin Bi(111) Films Grown on Bi2Te3(111) Substrates: Evidence for a Strain-Induced Topological Phase Transition

Author

Japanese:	Hirahara, T., Fukui, N., Shirasawa, T., Yamada, M., Aitani, M., Miyazaki, H., Matsunami, M., Kimura, S., Takahashi, T., Hasegawa, S., Kobayashi, K., 平原徹.
English:	Hirahara, T., Fukui, N., Shirasawa, T., Yamada, M., Aitani, M., Miyazaki, H., Matsunami, M., Kimura, S., Takahashi, T., Hasegawa, S., Kobayashi, K., Toru Hirahara.

Language

English

Journal/Book name

Japanese:	Physical Review Letters
English:	Physical Review Letters

Volume, Number, Page

Vol. 109 No. 22 pp. 5

Published date

2012

Publisher

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English:

Conference name

Japanese:
English:

Conference site

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English:

Official URL

DOI