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Publication Information
Title
Japanese:
English:
Effect of increasing gate capacitance on the performance of a p-MoS2/HfS2 van der Waals heterostructure tunneling field-effect transistor
Author
Japanese:
張 文倫
,
祢津 誠晃
,
金澤 徹
,
雨宮 智宏
,
宮本 恭幸
.
English:
W Zhang
,
S. Netsu
,
T. Kanazawa
,
T. Amemiya
,
Y. Miyamoto
.
Language
English
Journal/Book name
Japanese:
English:
Jpn. J. Appl. Phys
Volume, Number, Page
58, SBBH02 (2019)
Published date
Jan. 15, 2019
Publisher
Japanese:
English:
Conference name
Japanese:
English:
Conference site
Japanese:
English:
DOI
https://doi.org/10.7567/1347-4065/aaf699
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Tokyo Institute of Technology All rights reserved.