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Publication Information
Title
Japanese:
English:
Leakage current characteristics of new SrBi4Ti4O 15/CaBi4Ti4O15 thin-film capacitor with excellent electric stability
Author
Japanese:
Kawahara, H., Tahara, N., Nomura, S., Yamashita, K., Noda, M., Uchida, H.,
舟窪浩
.
English:
Kawahara, H., Tahara, N., Nomura, S., Yamashita, K., Noda, M., Uchida, H.,
HIROSHI FUNAKUBO
.
Language
English
Journal/Book name
Japanese:
English:
IMFEDK 2013 - 2013 International Meeting for Future of Electron Devices, Kansai
Volume, Number, Page
pp. 80-81
Published date
2013
Publisher
Japanese:
English:
Conference name
Japanese:
English:
Conference site
Japanese:
English:
DOI
https://doi.org/10.1109/IMFEDK.2013.6602250
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Tokyo Institute of Technology All rights reserved.