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Publication Information
Title
Japanese:
English:
Trade-off Relation between Mobility and Reliability in Oxide TFTs: Possible Origins and Experimental Demonstration
Author
Japanese:
金 正煥
,
Shiah Yu-Shien
,
方 俊皓
, Katsumi Abe,
細野 秀雄
.
English:
Junghwan Kim
,
Yu-Shien Shiah
,
Joonho Bang
, Katsumi Abe,
Hideo Hosono
.
Language
English
Journal/Book name
Japanese:
English:
Volume, Number, Page
Published date
Aug. 2019
Publisher
Japanese:
English:
Conference name
Japanese:
English:
International Meeting on Information Display (IMID)
Conference site
Japanese:
English:
Gyeongju
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Tokyo Institute of Technology All rights reserved.