Trade-off Relation between Mobility and Reliability in Oxide TFTs: Possible Origins and Experimental Demonstration

Publication Information

Title

Japanese:
English:	Trade-off Relation between Mobility and Reliability in Oxide TFTs: Possible Origins and Experimental Demonstration

Author

Japanese:	金正煥, Shiah Yu-Shien, 方俊皓, Katsumi Abe, 細野秀雄.
English:	Junghwan Kim, Yu-Shien Shiah, Joonho Bang, Katsumi Abe, Hideo Hosono.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Aug. 2019

Publisher

Japanese:
English:

Conference name

Japanese:
English:	International Meeting on Information Display (IMID)

Conference site

Japanese:
English:	Gyeongju