【IMPORTANT】T2R2 and STAR Search: Service Discontinuation and Successor Systems Japanese

Home > Help Publication Information Title Japanese: ホットスポットテストケースに用いられるデータベースの分析  English: Analysis of databases used for hot spot test cases  Author Japanese: 小椋弘貴, 高橋秀和, 佐藤真平, 高橋篤司.   English: Hiroki Ogura, Hidekazu Takahashi, Shimpei Sato, Atsushi Takahashi.   Language Japanese  Journal/Book name Japanese: 電子情報通信学会技術研究報告  English: Technical Committee on VLSI Design Technologies, IEICE Technical Report (VLD2019-52)  Volume, Number, Page Vol. 119    No. 282    pp. 191-196 Published date Nov. 2019  Publisher Japanese:   English:   Conference name Japanese:   English:   Conference site Japanese:   English:

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