Fabrication and Characterization of a Ferroelectric-Gate FET With a ITO/PZT/SRO/Pt Stacked Structure

Publication Information

Title

Japanese:
English:	Fabrication and Characterization of a Ferroelectric-Gate FET With a ITO/PZT/SRO/Pt Stacked Structure

Author

Japanese:	TRONG TUE PHAN, Bui Nguyen Quoc Trinh, 宮迫毅明, 徳光永輔, 下田達也.
English:	Phan Trong Tue, Bui Nguyen Quoc Trinh, Takaaki Miyasako, Eisuke Tokumitsu, Tatsuya Shimoda.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

pp. 32-35

Published date

Jan. 20, 2011

Publisher

Japanese:
English:	IEEE

Conference name

Japanese:
English:	The 22nd International Conference on Microelectronics

Conference site

Japanese:
English: