Nanostructure Analyses of Hafnia-Based Ferroelectric Thin Films by Aberration-Corrected Electron Microscopy

Publication Information

Title

Japanese:
English:	Nanostructure Analyses of Hafnia-Based Ferroelectric Thin Films by Aberration-Corrected Electron Microscopy

Author

Japanese:	木口賢紀, 白石貴久, 三村和仙, 清水荘雄, 舟窪浩, Toyohiko J. Konno.
English:	Takanori Kiguchi, Takahisa Shiraishi, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo, Toyohiko J. Konno.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Aug. 18, 2019

Publisher

Japanese:
English:

Conference name

Japanese:
English:	PRICM 10 (The 10th International Conference Pacific Rim on Advanced Materials and Processing)

Conference site

Japanese:
English:	Xi’an