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Title
Japanese: 
English:Bipolar Transistor Test Structures for Extracting Minority Carrier Lifetime in IGBTs 
Author
Japanese: Kiyoshi Takeuchi, Munetoshi Fukui, Takuya Saraya, Kazuo Itou, Toshihiko Takakura, Shinichi Suzuki, Yohichiroh Numasawa, Naoyuki Shigyo, 角嶋 邦之, 星井 拓也, Kazuyoshi Furukawa, 渡辺 正裕, 若林 整, 筒井 一生, 岩井 洋, Atsushi Ogura, Wataru Saito, Shin-ichi Nishizawa, Masanori Tsukuda, Ichiro Omura, 大橋 弘通, Toshiro Hiramoto.  
English: Kiyoshi Takeuchi, Munetoshi Fukui, Takuya Saraya, Kazuo Itou, Toshihiko Takakura, Shinichi Suzuki, Yohichiroh Numasawa, Naoyuki Shigyo, Kuniyuki Kakushima, Takuya Hoshii, Kazuyoshi Furukawa, Masahiro Watanabe, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai, Atsushi Ogura, Wataru Saito, Shin-ichi Nishizawa, Masanori Tsukuda, Ichiro Omura, Hiromichi Ohashi, Toshiro Hiramoto.  
Language English 
Journal/Book name
Japanese: 
English:IEEE Trans. On Semiconductor Manufactureing 
Volume, Number, Page Vol. 33    No. 2    pp. 159-165
Published date May 2020 
Publisher
Japanese: 
English: 
Conference name
Japanese: 
English: 
Conference site
Japanese: 
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