Crystal Growth and Characterization of Topological Insulator BiSb Thin Films by Sputtering Deposition for SOT-MRAM Applications

Publication Information

Title

Japanese:
English:	Crystal Growth and Characterization of Topological Insulator BiSb Thin Films by Sputtering Deposition for SOT-MRAM Applications

Author

Japanese:	脱凡, Tobah Mustafa, 白倉孝典, NGUYEN Khang H D, PHAM NAM HAI.
English:	Tuo Fan, Mustafa Tobah, Takanori Shirokura, Nguyen Huynh Duy Khang, Pham Nam Hai.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Sept. 27, 2020

Publisher

Japanese:
English:

Conference name

Japanese:
English:	SSDM 2020

Conference site

Japanese:
English: