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Title
Japanese:イオンビーム及びX線照射に伴う模擬文化財試料の損傷のFT-IR測定 
English: 
Author
Japanese: 小栗慶之, 長谷川 純, 福田一志, 羽倉尚人.  
English: YOSHIYUKI OGURI, Jun Hasegawa, hitoshi fukuda, Naoto Hagura.  
Language Japanese 
Journal/Book name
Japanese: 
English: 
Volume, Number, Page        
Published date Mar. 16, 2020 
Publisher
Japanese: 
English: 
Conference name
Japanese:日本原子力学会2020年春の年会 
English: 
Conference site
Japanese:福島県福島市 
English: 

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