Proactive useless data flush architecture for nonvolatile SRAM using magnetic tunnel junctions | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	Proactive useless data flush architecture for nonvolatile SRAM using magnetic tunnel junctions

Author

Japanese:	北形大樹, 山本修一郎, 菅原聡.
English:	Daiki Kitagata, Shuichiro Yamamoto, SATOSHI SUGAHARA.

Language

English

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English:

Volume, Number, Page

Published date

Feb. 17, 2020

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