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Publication Information
Title
Japanese:
English:
Barkhausen Noise Analysis of Thin Film Ferroelectrics
Author
Japanese:
矢澤 慶祐
, Benjamin Ducharne,
内田 寛
,
舟窪 浩
, John E. Blendell.
English:
Keisuke Yazawa
, Benjamin Ducharne,
Hiroshi Uchida
,
Hiroshi Funakubo
, John E. Blendell.
Language
English
Journal/Book name
Japanese:
English:
Appl. Phys. Lett.
Volume, Number, Page
Vol. 117 pp. 012902-1-4
Published date
June 2020
Publisher
Japanese:
English:
Conference name
Japanese:
English:
Conference site
Japanese:
English:
DOI
https://doi.org/10.1063/5.0012635
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Tokyo Institute of Technology All rights reserved.