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Title
Japanese: 
English:High field-effect mobility with suppressed negative threshold voltage shift in 4H-SiC MOSFET with cerium oxide interfacial layer 
Author
Japanese: 宋 禛漢, 太田 惇丈, 星井 拓也, 若林 整, 筒井 一生, 角嶋 邦之.  
English: Jinhan Song, Atsuhiro Ohta, Takuya Hoshii, Hitoshi Wakabayashi, Kazuo Tsutsui, Kuniyuki Kakushima.  
Language English 
Journal/Book name
Japanese: 
English:Japanese Journal of Applied Physics (JJAP) (Rapid Communication) 
Volume, Number, Page Vol. 60        Page 30901
Published date Feb. 2021 
Publisher
Japanese: 
English: 
Conference name
Japanese: 
English: 
Conference site
Japanese: 
English: 
DOI https://doi.org/10.35848/1347-4065/abdf7c

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