Probe Microscopy analysis of neuromorphic resistive memory functions of amorphous oxide semiconductors

Publication Information

Title

Japanese:	Probe Microscopy analysis of neuromorphic resistive memory functions of amorphous oxide semiconductors
English:	Probe Microscopy analysis of neuromorphic resistive memory functions of amorphous oxide semiconductors

Author

Japanese:	Atsushi Tsurumaki-Fukuchi, Takayoshi Katase, Hiromichi Ohta, Masashi Arita, Yasuo Takahashi.
English:	Atsushi Tsurumaki-Fukuchi, Takayoshi Katase, Hiromichi Ohta, Masashi Arita, Yasuo Takahashi.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

July 6, 2021

Publisher

Japanese:
English:

Conference name

Japanese:	The Twelfth International Conference on the Science and Technology for Advanced Ceramics (STAC12)
English:	The Twelfth International Conference on the Science and Technology for Advanced Ceramics (STAC12)

Conference site

Japanese:
English: