逆ペロブスカイト型酸化物Ba3(Si,Ge)Oの高純度バルク合成と電気特性評価

Publication Information

Title

Japanese:	逆ペロブスカイト型酸化物Ba3(Si,Ge)Oの高純度バルク合成と電気特性評価
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Author

Japanese:	木村茂, ホシンイ, 片瀬貴義, 井手啓介, 平松秀典, 細野秀雄, 神谷利夫.
English:	S. Kimura, Xinyi He, Takayoshi Katase, Keisuke Ide, hidenori hiramatsu, HIDEO HOSONO, TOSHIO KAMIYA.

Language

Japanese

Journal/Book name

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Volume, Number, Page

Published date

Nov. 11, 2021

Publisher

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Conference name

Japanese:	薄膜材料デバイス研究会第18回研究集会
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Conference site

Japanese:
English: