CMOS論理回路におけるTIDの影響評価

Publication Information

Title

Japanese:	CMOS論理回路におけるTIDの影響評価
English:	Evaluation of TID effect in CMOS logic circuits

Author

Japanese:	安藤幹, 大島佑太, 平川顕二, 岩瀬正幸, 小笠原宗博, 依田孝, 石原昇, 伊藤浩之.
English:	Motoki Ando, Yuta Oshima, Kenji Hirakawa, Masayuki Iwase, Munehiro Ogasawara, Takashi Yoda, Noboru Ishihara, Hiroyuki Ito.

Language

Japanese

Journal/Book name

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Volume, Number, Page

Published date

Mar. 19, 2019

Publisher

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Conference name

Japanese:	2019年電子情報通信学会総合大会
English:

Conference site

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