Minority Carrier Lifetime Measurement for SiC Epitaxial Layer

Publication Information

Title

Japanese:	SiCエピタキシャル層の少数キャリア寿命の測定手法の提案
English:	Minority Carrier Lifetime Measurement for SiC Epitaxial Layer

Author

Japanese:	佐々木杏民, 宋禛漢, 星井拓也, 若林整, 筒井一生, 水島一郎, 依田孝, 角嶋邦之.
English:	K. Sasaki, J. Song, T. Hoshii, H. Wakabayashi, K. Tsutsui, I. Mizushima, T. Yoda, K. Kakushima.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Nov. 2018

Publisher

Japanese:
English:

Conference name

Japanese:	先進パワー半導体分科会第5回講演会
English:	The 5th Meeting on Advanced Power Semiconductors

Conference site

Japanese:	京都
English: