(Invited) High Thermal Reliability and High Spin Hall Angle Observed in SOT-Reader Thin Films Using BiSbX Topological Insulators

Publication Information

Title

Japanese:
English:	(Invited) High Thermal Reliability and High Spin Hall Angle Observed in SOT-Reader Thin Films Using BiSbX Topological Insulators

Author

Japanese:	B.R. York, Q. Le, X. Liu, S. Okamura, C. Hwang, M.A. Gribelyuk, S. Le, J. Liu, R. Simmons, M. Maeda, 脱凡, Y. Tao, J. Ohno, H. Takano, PHAM NAM HAI, HO HOANG HUY, 南波章太.
English:	B.R. York, Q. Le, X. Liu, S. Okamura, C. Hwang, M.A. Gribelyuk, S. Le, J. Liu, R. Simmons, M. Maeda, F. Tuo, Y. Tao, J. Ohno, H. Takano, P.N. Hai, H. H. Huy, S. Namba.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

July 31, 2023

Publisher

Japanese:
English:

Conference name

Japanese:
English:	TMRC 2023

Conference site

Japanese:
English:	Minnesota