Extraction of Reflection Coefficient in Silicon Waveguides using Multiple Reflection Signals in OFDR

Tsuyoshi Horikawa; Atsushi Kitamura; Masanori Yatani; Nobuhiko Nishiyama

Publication Information

Title

Japanese:
English:	Extraction of Reflection Coefficient in Silicon Waveguides using Multiple Reflection Signals in OFDR

Author

Japanese:	堀川剛, 北村敦, 八谷将典, 西山伸彦.
English:	Tsuyoshi Horikawa, Atsushi Kitamura, Masanori Yatani, Nobuhiko Nishiyama.

Language

English

Journal/Book name

Japanese:
English:	Proceedings of Conference on Lasers and Electro-Optics (CLEO 2024)

Volume, Number, Page

Published date

May 5, 2024

Publisher

Japanese:
English:

Conference name

Japanese:
English:	Conference on Lasers and Electro-Optics (CLEO 2024)

Conference site

Japanese:
English:	Charlotte, North Carolina

Abstract

We, for the first time, formulated the behavior of multiple reflections in waveguides with distributed reflections and demonstrated the precise extraction of reflection coefficients in silicon waveguides from OFDR reflection-distance profiles.

Home

Search

Support

About T2R2

Related Links

Publication Information