Atomic Scale and Electronic Structure Characterization of Amorphous Tantalum Oxide Thin Films via Synchrotron X-ray Techniques

Publication Information

Title

Japanese:	Atomic Scale and Electronic Structure Characterization of Amorphous Tantalum Oxide Thin Films via Synchrotron X-ray Techniques
English:	Atomic Scale and Electronic Structure Characterization of Amorphous Tantalum Oxide Thin Films via Synchrotron X-ray Techniques

Author

Japanese:	Loku Singgappulige Rosantha Kumara, Sakura Yoshikawa, Atsushi Shimizu, Linwei Li, Takayoshi Katase, Seo Okkyun, Takeshi Watanabe, Masugu Sato, Osami Sakata, Atsushi Fukuchi, Toshio Kamiya.
English:	Loku Singgappulige Rosantha Kumara, Sakura Yoshikawa, Atsushi Shimizu, Linwei Li, Takayoshi Katase, Seo Okkyun, Takeshi Watanabe, Masugu Sato, Osami Sakata, Atsushi Fukuchi, Toshio Kamiya.

Language

English

Journal/Book name

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English:

Volume, Number, Page

Published date

Dec. 1, 2024

Publisher

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Conference name

Japanese:	AsCA2024
English:	AsCA2024

Conference site

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English: