Japanese
Home
Search
Horizontal Search
Publication Search
( Advanced Search )
Patent Search
( Advanced Search )
Research Highlight Search
( Advanced Search )
Researcher Search
Search by Organization
Support
FAQ
T2R2 User Registration
Doctoral thesis registration
Support/Contact
About T2R2
What's T2R2?
Operation Guidance
Leaflets
About file disclosure
Related Links
Science Tokyo
STAR Search
NII IR Program
Home
>
Help
Publication Information
Title
Japanese:
OPC において要求光強度が近傍で不均一な状況におけるマスクパターン修正方法
English:
Mask Pattern Modification Method for OPC to Reduce the Non-uniform Light Intensity
Author
Japanese:
野崎翔太郎
,
高橋篤司
.
English:
Shotaro Nozaki
,
Atsushi Takahashi
.
Language
Japanese
Journal/Book name
Japanese:
DAシンポジウム2024 論文集
English:
Proc. DA Symposium 2024, IPSJ Symposium Series
Volume, Number, Page
pp. 57-64
Published date
Aug. 2024
Publisher
Japanese:
English:
Conference name
Japanese:
English:
Conference site
Japanese:
English:
Official URL
http://id.nii.ac.jp/1001/00238114/
©2007
Institute of Science Tokyo All rights reserved.